Method of Repairing Micromirrors in Spatial Light Modulators

ABSTRACT

Disclosed herein is method of operating a device that comprises an array of micromirrors. The method comprises a process usable for repairing stuck micromirrors of the micromirror array during the operation. The reparation process applies, at the ON state, two consecutive refresh voltages to the mirror plates of the micromirrors in the array with the pulses being separated in time longer than the characteristic oscillation time of the micromirrors. The reparation process can be applied independently to the micromirrors. Alternatively, the reparation process can be incorporated with a bias inversion process.

TECHNICAL FIELD OF THE INVENTION

The present invention is related generally to the art of spatial lightmodulators having micromirror arrays, and more particularly, to a methodand an apparatus for operating the micromirror array of the spatiallight modulator in producing videos.

BACKGROUND OF THE INVENTION

Microstructures, such as micromirror devices, have found manyapplications in basic signal transduction. For example, a spatial lightmodulator based on micromirror device steers light in response toelectrical or optical signals. Such a modulator can be a part of acommunication device or an information display.

A major factor that limits the reliability and widespread use ofmicromirror devices is adhesion. Adhesion is a result of the dominanceof surface and interfacial forces, such as capillary, chemical bonding,electrostatic, and van der Waals forces, over mechanical forces whichtend to separate micromirror device components. When mechanicalrestoring forces cannot overcome adhesive forces, the micromirrordevices are said to suffer from stiction. Stiction failures incontacting micromirror devices, can occur after the first contactingevent (often referred to as initial stiction), or as a result ofrepeated contacting events (often referred to as in-use stiction).Initial stiction is often associated with surface contamination (e.g.,residues of bonding materials or photoresist), or with high energy ofcontacting surfaces (e.g., clean oxidized silicon or metallic surfaces).For the case of in-use stiction, each time one part of the micromirror(e.g. mirror plate of a micromirror device) touches the other (e.g.stopping mechanism) or the substrate, the contact force grows andultimately becomes too large for the restoring force to overcome. Inthis case, the device remains in one state indefinitely. This phenomenoncan arise from a variety of underlying mechanisms, such as contact areagrowth, creation of high-energy surface by micro-wear, surface chargeseparation etc.

The stiction of the micromirrors often exhibits dynamic characters. Forexample, the stiction in a micromirror can vary over time, and therestoration force necessary to overcome the stiction in the samemicromirror may also vary over time. In a micromirror array device, suchas a micromirror-based spatial light modulator, the stiction may occurin different micromirrors at different times in operation. Such stictionin individual micromirrors may also vary over time.

Therefore, what is needed is a method and apparatus for repairing thestuck micromirrors.

SUMMARY OF THE INVENTION

In view of the foregoing, the present invention provides a method andapparatus for repairing the stuck micromirrors with refresh voltagepulses. The reparation can be performed dynamically during operation ofthe micromirrors. Alternatively, it can be performed when themicromirrors are not in operation. Such objects of the invention areachieved in the features of the independent claims attached hereto.Preferred embodiments are characterized in the dependent claims.

In an embodiment of the invention, a method of operating an array ofmicromirrors in displaying a video comprising a set of frames, whereineach micromirror comprises a deflectable mirror plate and an addressingelectrode associated with the mirror plate is disclosed. The methodcomprises: switching the micromirrors between an ON and OFF state duringa sequence of frame periods corresponding to the frames; and performinga reparation process within a frame period of the sequence of frameperiods, wherein the reparation process comprises: turning themicromirrors of the array to the OFF state; and applying first andsecond refresh voltage pulses to the mirror plates of the micromirrorsin the array, wherein the refresh voltage pulses are separated in timelonger than a characteristic oscillation time of the micromirrors.

In another embodiment of the invention, a method is disclosed. Themethod comprises: illuminating an array of micromirrors with anillumination light, wherein each micromirror comprises a reflectivedeflectable mirror plate and an addressing electrode associated with themirror plate for deflecting the mirror plate; operating the micromirrorsaccording to the method of claim 100; and projecting the reflectedillumination light from the deflected micromirrors onto a display targetso as to produce the desired video.

BRIEF DESCRIPTION OF DRAWINGS

While the appended claims set forth the features of the presentinvention with particularity, the invention, together with its objectsand advantages, may be best understood from the following detaileddescription taken in conjunction with the accompanying drawings ofwhich:

FIG. 1 illustrates an exemplary display system employing a spatial lightmodulator having an array of micromirrors in which embodiments of theinvention can be implemented;

FIG. 2 illustrates a cross-section of a portion of the spatial lightmodulator in FIG. 1;

FIG. 3 illustrates a exploded cross-sectional view of a micromirrordevice in FIG. 2;

FIG. 4 a diagrammatically plots voltages used in operating themicromirror device according to an embodiment of the invention;

FIG. 4 b diagrammatically plots voltages used in operating themicromirror device according to another embodiment of the invention;

FIG. 5 a illustrates, in cross-section view, the micromirror with thevoltages as plotted in FIG. 4;

FIG. 5 b schematically illustrates the status of the deformable hinge ofthe micromirror before and after the application of the refresh voltagepulse;

FIG. 6 diagrammatically plots voltages used in operating the micromirrordevice according to yet another embodiment of the invention;

FIG. 7 a diagrammatically plots first refresh pulse used in repairingthe stuck micromirrors according to an embodiment of the invention;

FIG. 7 b diagrammatically plots second refresh pulse following the firstrefresh pulse in FIG. 7 a used in repairing the stuck micromirrorsaccording to the embodiment of the invention;

FIG. 8 diagrammatically plots voltages used in operating the micromirrordevice according to yet another embodiment of the invention;

FIG. 9 is a perspective view of an exemplary micromirror device useablein the spatial light modulator of FIG. 1;

FIG. 10 schematically illustrates a top view of the deflectable mirrorplate of the micromirror device of FIG. 9;

FIG. 11 is a perspective view of another exemplary micromirror deviceuseable in the spatial light modulator of FIG. 1; and

FIG. 12 schematically illustrates a top view of the deflectable mirrorplate of the micromirror device of FIG. 1.

FIG. 13 is a perspective view of an exemplary spatial light modulator ofFIG. 1;

FIG. 14 is a top view of another exemplary spatial light modulator ofFIG. 1;

FIG. 15 schematically shows an exemplary circuitry array that isconnected to an array of electrodes for deflecting the micromirrors ofthe spatial light modulators;

FIG. 16 schematically shows a top view of another exemplary micromirrorarray;

FIG. 17 schematically shows a top view of yet another exemplarymicromirror array;

FIGS. 18 a to 19 schematically show a top view of another exemplarymicromirror array device comprising an array of electrodes and circuitryand micromirrors;

FIG. 20 schematically illustrates circuits in which embodiments of theinvention can be implemented; and

FIG. 21 illustrates an exemplar circuits for controlling the voltagesapplied to the micromirrors.

DETAILED DESCRIPTION OF THE EMBODIMENTS

In order to repair the stuck micromirrors, refresh pulses are applied tothe micromirrors so as to produce additional mechanical restorationforces in the micromirrors. The additional mechanical restoration forceis added to the restoration force in the micromirrors so as to enhancethe restoration force.

In the instance of operating an array of micromirrors, reparationprocedures are initiated according to a predetermined schedule. In eachreparation procedure, voltages of the micromirrors of the array are setto values such that the micromirrors are expected to be at the OFFstate. Refresh voltage pulses are then applied to the micromirrors ofthe array. In the presence and after the application of the refreshvoltage pulse, the micromirrors at the OFF state are not affected, andmaintain their positions at the OFF state. However, the stuckmicromirrors due to the in-site stiction are further deflected so as toproduce additional deformation, under which additional mechanicalrestoration energy can be derived. The additional restoration energy isadded to the stored restoration energy in the micromirrors and thus,helping to drive these stuck micromirrors to the OFF state.

For liberating all stuck micromirrors, the refresh voltage pulsesapplied each time preferably comprise two consecutive pulses with thetime interval therebetween is longer than the intrinsic time period ofthe micromirrors, such as the reciprocal of the resonant frequency ofthe micromirrors. Of course, the time interval between the twoconsecutive refresh voltage pulses can be shorter than the intrinsictime period of the micromirrors. The reparation procedure can be carriedout during each frame period. Alternatively, it can be performed at anypredetermined time period.

The reparation procedure can be incorporated with other procedures, suchas bias inversion that is performed primarily for eliminating staticcharge accumulation. For example, the polarity of the bias voltage (thevoltage of the deflectable mirror plate) can be inversed atpredetermined times during operation so as to dynamically eliminateaccumulated static charge in the micromirror. During the course of thebias voltage inversion, first refresh voltage pulse can be applied so asto liberate the stuck micromirrors from stiction followed by theapplication of the second refresh voltage pulse. The two refresh voltagepulses preferably have opposite polarities, and have a time intervaltherebetween of longer than the intrinsic time (e.g. the reciprocal ofthe resonant frequency) of the micromirrors but shorter than the time tocomplete the inversion.

In the following, embodiments of the present invention will beillustrated with particular examples wherein the micromirrors aremembers of spatial light modulators in display systems. However, it willbe immediately understood by those skilled in the art that the followingexamples are for demonstration purposes only, and it will not beinterpreted as a limitation. Instead, any variations without departingfrom the spirit of the invention are also applicable. For example, thepresent invention can also be applied to other type ofmicroelectromechanical devices in which in-site stiction may occur, suchas micromirrors in optical switches.

Turning to the drawings, an exemplary micromirror based display systemis illustrated in FIG. 1. In its basic configuration, display system 100comprises illumination system 116 for producing sequential color light,spatial light modulator 110, optical element 108 for directingillumination light from the illumination system onto the spatial lightmodulator, and optical element 112 that projects the reflectedillumination light onto display target 114.

Illumination system 116 further comprises light source 102, which can bean arc lamp, lightpipe 104 that can be any suitable integrator of lightor light beam shape changer, and color filter 106, which can be a colorwheel. The filter in this particular example is positioned after lightpipe 104 at the propagation path of the illumination light. In anotherexample, the color filter can be positioned between the light source andlight pipe 104, which is not shown in the figure.

The present invention is also applicable to other micromirror baseddisplay systems, such as a display system employing more than onespatial light modulator of micromirrors. For example, a display systemmay employ three separate micromirror based spatial light modulatorswith each being designated for modulating a primary color. The modulatedprimary colors are then combined together to produce full color image orvideo.

FIG. 2 illustrates a cross-section view of an exemplary spatial lightmodulator in FIG. 1. For simplicity purposes, only eight micromirrordevices are illustrated therein. In general, the micromirror array of aspatial light modulator consists of thousands or millions ofmicromirrors, the total number of which determines the resolution of thedisplayed images. For example, the micromirror array of the spatiallight modulator may have 1024×768, 1280×720, 1400×1050, 1600×1200,1920×1080 or even larger number of micromirrors. In other applications,the micromirror array may have less number of micromirrors.

In this example, the array of deflectable reflective mirror plates (e.g.124) is disposed between light transmissive substrate 120 andsemiconductor substrate 122 having formed thereon an array of addressingelectrodes (e.g. addressing electrode 126) each of which is associatedwith a mirror plate for electrostatically deflecting the mirror plate.In operation, the illumination light passes through the lighttransmissive substrate and illuminates the reflective surfaces of themirror plates, from which the illumination light is modulated. Thereflected illumination light from the mirror plates at the ON state iscollected by the projection lens (e.g. projection lens 112 in FIG. 1) soas to generate a “bright” pixel in the display target (e.g. displaytarget 114 in FIG. 1). The reflected illumination from the mirror platesat the OFF state travels away from the projection lens, resulting in thecorresponding pixels in the display target to be “dark.”

In an alternative configuration, the deflectable reflective mirrorplates can be formed on the semiconductor substrate having theaddressing electrode, in which instance, the light transmissivesubstrate may not be provided, which is not shown in the figure.

The micromirrors in the array can be arranged in many suitable ways. Forexample, the micromirrors can be arranged such that the center-to-centerdistance between the adjacent mirror plates can be 10.16 microns orless, such as 4.38 to 10.16 microns. The nearest distance between theedges of the mirror plate can be from 0.1 to 1.5 microns, such as from0.15 to 0.45 micron, as set forth in U.S. patent application Ser. No.10/627,302, Ser. No. 10/627,155, and Ser. No. 10/627,303, both to Patel,filed Jul. 24, 2003, the subject matter of each being incorporatedherein by reference.

As a way of example, an exemplary micromirror in FIG. 2 is schematicallyillustrated in a cross-section view in FIG. 3. Referring to FIG. 3,micromirror 118 comprises deflectable mirror plate 124 having areflective surface for reflecting the illumination light to bemodulated. The mirror plate is attached to deformable hinge 129 (e.g. atorsion hinge) via hinge contact 128 with the deformable hinge beingheld and supported by post 133 on substrate 120 such that the mirrorplate can be deflected (rotated) relative to the substrate. Thedeflection of the mirror plate is achieved by electrostatic fieldestablished between the mirror plate and addressing electrode 126. Inaccordance with an embodiment of the invention, only one addressingelectrode is provided for the micromirror. Alternatively, multipleaddressing electrodes can be provided for each micromirror. Stopper 130is provided to limit the rotation of the mirror plate in accordance withthe operation states, such as the ON state when the micromirror isoperated in a binary mode including the ON and OFF state. The stopper130 can be formed in many alternative ways, such as those set forth inU.S. patent application Ser. No. 10/437,776 filed Apr. 13, 2003 and Ser.No. 10/613,379 filed Jul. 3, 2003, Ser. No. 10/703,678 filed Nov. 7,2003, the subject matter of each being incorporated herein by reference.

In operation, the mirror plate rotates towards the ON state positionwith the electrostatic field established between the mirror plate andaddressing electrode. The rotation of the mirror plate is stopped by thestopper when the mirror plate arrives at the ON state angle, in whichsituation the mirror plate abuts against the stopper. During therotation of the mirror plate to the ON state angle, the hinge isdeformed, and restoration energy due to such deformation is stored inthe hinge. When the OFF state is desired, the voltages of the mirrorplate and the addressing electrode are reduced such that the resultedelectrostatic field cannot balance the restoration energy stored in thedeformable hinge. Therefore, the mirror plate departs from the ONposition and returns to the OFF state.

However, the mirror plate may not be able to depart from the ON statewhen the restoration force can not overcome the surface force betweenthe contact surfaces of the mirror plate and the stopper, even throughthe electrostatic field between the mirror plate and the addressingelectrode is reduced to zero, in which situation the in-use stictionoccurs. In order to liberate the stuck mirror plate from stiction,reparation process comprising refresh voltage pulses are performed withthe voltage pulses being applied to the mirror plate so as to produceadditional restoration energy. Specifically, refresh voltage pulsesforce the mirror plate to move towards the addressing electrode andthus, producing additional deformation in the deformable hinge. Theadditional deformation results in additional mechanical restorationenergy that is added to and thus, enhancing the stored restorationenergy in the hinge.

The refresh voltage pulse can be applied in many ways. As a way ofexample in a video display application wherein the video comprises asequence of frames, one single refresh voltage pulse is applied in oneframe period, as illustrated in FIG. 4 a.

Referring to FIG. 4 a, during frame period (0, T), bias voltage V_(bias)is applied to the mirror plate. Voltage V_(e) on the addressingelectrode (e.g. electrode 126 in FIG. 3) varies over time according tothe image data (e.g. image data generated according to apulse-width-modulation algorithm) so as to switch the mirror platebetween the ON and OFF states. On or around the termination of the frameperiod T, refresh voltage pulse V_(refresh), represented by the thickline, is added to the bias voltage V_(bias). The peak value of therefresh pulse can be the same as, and is preferably 1.5 times or more,such as 2 times or more, 3 times or more, or 5 times or more, or 10times or more of the amplitude of the bias voltage V_(bias) beforeapplication of the refresh voltage. The duration of the refresh pulsecan be 5 microseconds or less, such as 2 microseconds or less and 1microsecond or less. The polarity of the refresh voltage pulse may ormay not be the same as the polarity of the bias voltage immediatelybefore the refresh pulse.

In accordance with another embodiment of the invention, the reparationprocess comprising the refresh pulses can be applied during colorfields, as shown in FIG. 4 b. Referring to FIG. 4 b, the frame hasmultiple color fields. The color fields are defined by the configurationof the color wheel as shown in FIG. 1, as set forth in U.S. patentapplication Ser. No. 10/899,635 filed Jul. 26, 2004, Ser. No. 10/899,637filed Jul. 26, 2004, Ser. No. 10/771,231 filed Feb. 3, 2003, the subjectmatter of each being incorporated herein by reference.

For demonstration purposes only, FIG. 4 b illustrates the color fieldsproduced by a color wheel having red, green, and blue segments. Thecolor wheel spins two rounds in a frame period. Accordingly, the framehas red, green, blue, red, green, and blue segments. The adjacent colorfields have an intervening spoke filed that is associated with thetransition of the color fields in the color wheel when the color isspinning. The frame period can be split into two consecutive sub-frameseach of which comprises a red, green, and blue field, as shown in thefigure. In the embodiment of the invention, the reparation process canbe performed for each or selected color fields. Alternatively, thereparation can be performed during each or only selected sub-frames. Theselections for the individual color fields or sub-frames for performingthe reparation can be made according to a predefined criterion. Forexample, the selection can be every other color fields (or sub-frames),or every certain number of color fields (sub-frames), or random. In anysituation, it is preferred that the refresh voltage pulses of thereparation processes are initiated and performed during the spokeperiods so as to avoid losing optical efficiency of the display system.This arises from the fact that during the spoke periods, image data arenot loaded to the micromirrors, and the micromirrors are “blanked”during the spoke periods.

In accordance with yet another embodiment of the invention, thereparation process can be performed such that the ratio of the totalnumber switches of the micromirrors between the ON and OFF (i.e. fromthe ON to OFF and from OFF to ON) to the total number refresh voltagepulses applied to the micromirrors is greater than 1, such as greaterthan 2, or 3, or 4.

Referring to FIG. 5 a, mirror plate 124 is at the ON state withdeformable hinge 132 at position F in the presence of the bias voltageV_(bias) before application of the refresh voltage V_(refresh). When therefresh voltage pulse V_(refresh) is applied, the mirror plate rotatesaround the contact point of the mirror plate to position and stopper 130towards addressing electrode 126 and to position B; and deformable hingedeforms from position G to position F, resulting additional deformation(e.g. displacement d) of the deformable hinge. The additionaldeformation is better illustrated in FIG. 5 b. As can be seen in FIG. 5b, deformable hinge 132 has an additional deformation d from position Gto position F in the presence of the bias voltage having the refreshvoltage pulse. Such additional deformation d is added up to thedeformation of the deformable hinge established during the rotation ofthe mirror plate to the ON state, and thereby, increases the restorationenergy with which the mirror plate departs from the ON state towards theOFF state. After application of the refresh voltage pulse and removal(or reduction in amplitude) of the bias voltage, the mirror plate isreleased. The mirror plate departs from the ON state under the enhancedrestoration force derived from the enhanced restoration energy.

The present invention is also applicable in operations of a micromirrorarray device, such as the spatial light modulator in FIG. 1 having anarray of micromirrors. In operation, one or more micromirrors of thearray may be stuck due to in-site stiction. To repair the stuckmicromirrors, refresh voltage pulses can be applied.

In accordance with an embodiment of the invention, a reparation processis carried out according to a predetermined schedule. For example, onereparation process can be performed between two consecutive frames of asequence of frame periods in displaying a video. Alternatively, onereparation process is performed in each frame period. For anotherexample, the reparation process can be performed in selected frameperiods but preferably, at most once for each frame period. Within aframe period, the refresh process can be initiated at any time, such asat the beginning, or at the end of the frame period.

The reparation process in the embodiment comprises two consecutiverefresh voltage pulses with opposite polarities and in any order.Specifically, the first refresh voltage pulse may have the polarity thatis the same as or opposite to the polarity of the bias voltageimmediately prior to the refresh voltage pulses. The time intervalbetween the two consecutive voltage pulses is preferably longer than thecharacteristic oscillation time (e.g. the reciprocal of the resonantfrequency) of the micromirror. If the micromirrors of the array havedifferent resonant frequency, the time interval between the voltagepulses can be the reciprocal of the average resonant frequency. Forexample, the time interval between the two consecutive voltage pulsescan be 5 times or more, or 10 times or more, or 15 times or more of thecharacteristic oscillation period of the micromirror.

The reparation process of the present invention can also be incorporatedin other operation processes, such as bias inversion as set forth inU.S. patent application Ser. No. 10/607,687 filed Jun. 27, 2003, thesubject matter being incorporated herein by reference. In operating themicromirror and devices having an array of micromirrors, it is oftenadvantages to invert the voltage polarity so as to prevent static chargeaccumulation in micromirror devices, for example. The bias inversion canbe achieved by inverting the polarity of the bias voltage on thedeflectable mirror plate. Alternatively, the inversion process can beaccomplished by inverting the polarity of the voltage difference betweenthe deflectable mirror plate and the associated addressing electrode, asset forth in U.S. patent application Ser. No. 10/607,687 to Richardsfiled Jun. 27, 2003, the subject matter being incorporated herein byreference. An exemplary reparation process incorporated with biasinversion is demonstrated in FIG. 6.

Referring to FIG. 6, time is drawn in the horizontal axis; and voltageis in the vertical axis. During time period from T₁ to T₂, bias voltageV_(b+) having a positive polarity is applied to the mirror plates of themicromirrors in the micromirror array. Voltages on the addressingelectrodes of the electrode array associated with the micromirror arrayvary individually between V_(e+) and V_(e−) according to the image dataof the desired image. When the voltage of an addressing electrode isV_(e+), the voltage difference between voltages of the mirror plateV_(b+) and the addressing electrode V_(e+) is not sufficient to rotatethe mirror plate to the ON state, such as the ON state in FIG. 3. Whenthe voltage of an addressing electrode is V_(e−), the mirror platerotates to the ON state. The status of the micromirrors in themicromirror array is demonstrated in the dotted area in the figure.

At time T₂, the bias voltage is changed to low negative voltage V_(b0),and maintained at such low negative voltage during the followingtransition time period from T₂ to T. During the transition period fromT₂ to T, the mirror plates of the micromirrors in the array are expectedto be at the OFF state for both voltages V_(e−) and V_(e+) with the lownegative bias voltage. However, some of the mirror plates of themicromirrors in the micromirror array may experience in-site stiction,thus can not be in the OFF state. The addressing electrodes of the stuckmicromirrors may be at different voltages, i.e. V_(e+) and V_(e−). Inorder to repair these stuck micromirrors, a refresh voltage pulse isapplied to the micromirrors of the micromirror array at time T_(p)during the transition period, as shown in the figure. The refreshvoltage pulse has amplitude V_(r) and a negative polarity. Such refreshvoltage pulse drives the stuck mirror plates towards the addressingelectrodes associated with the stuck mirror plates, and causesadditional deflections in the stuck micromirrors. The additionaldeflection, in turn, produces additional mechanical restoration energythat is added to the restoration energy stored in the deformable hinge,thus, reinforcing the total restoration energy for moving the stuckmirror plates from the in-site stiction. After application of therefresh voltage pulse, the reinforced restoration energy is released,for example, from the deformed hinge, so as to liberate the stuck mirrorplate from the stiction.

At the stiction state, the addressing electrodes of some of the stuckmicromirrors are at voltage V_(e−) and the others are at V_(e+). For thegiven refresh voltage pulse with particular amplitude and polarity, thevoltage differences between the stuck mirror plates and associatedaddressing electrodes, thus the strengths of the produced additionalmechanical restoration forces (torques) are different. Specifically, thevoltage difference between the mirror plates and the addressingelectrodes at V_(e+) is larger than that between the mirror plates andthe associated addressing electrodes at V_(e−). As a consequence, theproduced additional mechanical restoration forces, as well as the totalreinforced restoration energy are also different in stuck micromirrorswhose addressing electrodes are at V_(e+) and V_(e−). The stuckmicromirrors with larger reinforced restoration energy can be liberatedfrom the stiction; however, the micromirrors with less reinforcedrestoration energy may not be successfully repaired. For this reason,another refresh voltage pulse at time T₄ also during the transitionperiod as shown in the figure is added to the bias voltage applied tothe mirror plates so as to repair the remaining stuck micromirrors afterapplication of the previous refresh voltage pulse. The second refreshvoltage pulse at time T₄ has amplitude of V_(r+) and a positive oppositeto that of the first refresh voltage pulse, such as positive polarity.Such second refresh voltage pulse results in a larger reinforcedrestoration energy in those stuck micromirrors whose addressingelectrodes are at V_(e−) than the reinforced restoration in those stuckmicromirrors whose addressing electrodes are at V_(e+). Therefore, thestuck micromirrors whose addressing electrodes are at both V_(e+) andV_(e−) are repaired and secured to depart from the stiction.

The two consecutive refresh pulses as discussed above can be configuredand applied in many ways. For example, the first refresh voltage pulseat time T_(p) can be applied at the ⅓ of the transition period, and thesecond refresh voltage pulse can be applied at the ⅔ of the transitionperiod. On general, the two consecutive refresh voltage pulses arepreferably separated in time longer than the characteristic oscillationtime (the reciprocal of the resonant frequency) of the micromirrors.Specifically, the time interval between the two consecutive voltagepulses can be 5 times or more, or 10 times or more, or 15 times or moreof the characteristic oscillation period of the micromirror. The peakvalue (amplitudes) of the refresh pulses are preferably 1.5 times ormore, such as 2 times or more, 3 times or more, or 5 times or more, or10 times or more of the amplitude of the bias voltage V_(bias) beforeapplication of the refresh voltage. The duration of each of the tworefresh pulses can be 5 microseconds or less, such as 2 microseconds orless and 1 microsecond or less. The two refresh pulses have oppositepolarities, but can be applied to the micromirrors in any order. Forexample, other than applying the first pulse with the negative polarityprior to the pulse with the positive polarity as shown in the figure,the pulse with positive polarity can be applied prior to the pulse withthe negative polarity.

The two refresh voltage pulses are applied to the micromirrors to repairthe stuck micromirrors. However, the non-stuck micromirrors (e.g. thosemicromirrors at the expected OFF state during time period from T₂ to T)are not affected. The reparation process (i.e. application of the twoconsecutive refresh voltage pulses) is preferably performed at most oncein each frame period of a sequence of frames. Alternatively, thereparation process can be performed for selected frame periods of asequence of frames, while the selection can be made by the user.

At time T, the bias voltage is changed to V_(b−) having a negativepolarity as opposed to the bias voltage before such inversion (e.g. thebias voltage prior to T₂ and during time period from T₁ to T₂). Duringthe following time period from T to T₅ in the following frame period,the micromirrors switches between the ON and OFF states according to theimage date of the desired image. At time T₅, another bias inversionprocess, as well as the reparation process, may be initiated but notrequired.

As a way of example, at time T₅, another bias inversion processincorporated with the reparation process is initiated, as shown in thenfigure. First refresh voltage pulse within transition period from T₅ to2T is applied. The first refresh voltage pulse has a magnitude of V_(r+)and a positive polarity. At time T₇, second refresh voltage pulse isapplied to the micromirrors so as to secure that all stuck micromirrorswhose addressing electrodes are at V_(e−) or V_(e+) are liberated fromstiction. At time 2T, the next frame period arrives. As a way ofexample, table 1 lists exemplary values of the above voltages.

TABLE 1 V_(e+) (Volt) V_(e−) (Volt) V_(b+) (Volt) V_(b−) (Volt) V_(r+)(Volt) V_(r−) (Volt) V_(b0) (Volt) +3.3 to +5 −15 to −25 V +20 to +40 V−20 to −40 +40 to +150 +40 to +150 −4

In another example, the bias voltages, voltages on the addressingelectrodes for the ON and OFF states can be other values. As a way ofexample, the ON state angle of the ON state for the micromirror devicesis 8° degrees or more, such as 10° degrees or more, or 12° degrees ormore, or 14° degrees or more, or 16° degrees or more. The OFF stateangle can be parallel to the substrate on which the mirror plate isformed, or −2° degrees or less, or −4° degrees or less. The voltagedifference between the mirror plate and the addressing electrode for themirror plate at the ON state can be 28 volts or more, such as 30 voltsor more, 35 volts or more or 40 volts or more. And such voltagedifference can be maintained for a time period corresponding to oneleast-significant-bit or more defined based on a pulse-width-modulationalgorithm for producing a desired image. The voltage difference betweenthe mirror plate and the addressing electrode for the mirror plate atthe OFF state can be 17 volts or less.

The above voltage difference can be achieved in many different ways byapplying different voltages to the mirror plate and the addressingelectrode associated with the mirror plate. As an aspect of theembodiment of the invention, the voltage applied to the addressingelectrode changes when the mirror plate switches between the ON and OFFstates. In particular, the voltage on the addressing electrode maychange polarity, for example, from positive to negative and vice versa.Such voltage change whether changing polarity or not, can be 10 volts ormore, or 15 volts or more, or 20 volts or more, and more preferably from13 to 25 volts.

The time duration of the applied voltage to the addressing electrode andmirror plate, may depend upon the image data of desired images accordingto a PWM algorithm. As an example, the duration of the applied voltageson the addressing electrode and mirror plate, as well as the voltagedifferences between the mirror plate and the addressing electrode (orthe voltage difference between the mirror plate and the conducting filmon the substrate if applicable) is 10 microseconds or more, such as 100microseconds or more, or 400 microseconds or more, or 600 microsecondsor more, or from 100 to 700 microseconds.

The voltage between the mirror plate and the addressing electrode can becan be 25 Volts or less, or more preferably 20 volts or less, or morepreferably 18 volts or less, such as from 5 to 18 volts, or from 10 to15 volts. A low operation voltage has many benefits, such ascost-effective and simplified design and fabrication, as set forth inU.S. patent application Ser. No. 10/982,259 filed Nov. 5, 2004, and U.S.patent application Ser. No. 10/340,162 filed Jan. 10, 2003, the subjectmatter of each being incorporate herein by reference.

The refresh voltage pulse as discussed above may be configured in avariety of ways. As a way of example, FIG. 7 a illustrates the explodedview of an example of the refresh voltage pulse at time T₄ in FIG. 6.Referring to FIG. 7 a, the refresh voltage pulse starts from biasvoltage V_(b0) during time Δt₁ with V_(b0) varying between V_(b0)(min)and V_(b0)(max). During time Δt₂ and the first half Δt₃ (Δt₂+½Δt₃), therefresh voltage increases monotonically, and reaches peak value V_(r+)whose maximum and minimum values are represented by V_(r+)(max) andV_(r+)(min) at half Δt₃. In the following second half of Δt₃ and Δt₄,the refresh voltage pulse decreases monotonically and returns to theinitial value of V_(b0) at the beginning of period Δt₅.

According to the invention, the duration of the refresh pulse, that isthe summation of Δt₁, Δt₂, Δt₃, Δt₄, and Δt₅, is preferably 5microseconds or less, such as 2 microseconds or less and 1 microsecondor less. Of course, the duration of the refresh voltage pulse may haveother different values. As a way of example, exemplary values of theparameters as discussed above are listed in table 2 and table 3.

TABLE 2 Δt₁ Δt₂ Δt₃ Δt₄ Δt₅ min (μs) 0 0.2 0.5 0.2 2.0 max (μs) — 0.51.0 0.5 —

TABLE 3 V_(b0) V_(b+) V_(b−) V_(r+) V_(r−) min (V) −4 (20 to 40) − 0.1(−20 to −40) + 0.1 (40 to 100) + 2.5 (−40 to −100) 5 max (V) −6 (20 to40) + 0.1 (−20 to −40) − 0.1 (40 to 100) + 5 (40 to 100) + 2.5

The exploded view of the refresh voltage pulse with a negative polarityis illustrated in FIG. 7 b. Referring to FIG. 7 b, the refresh voltagestarts from V_(b0) whose value lies within the range between V_(b0)(min)and V_(b0)(max). During time period Δt₂ and the first half Δt₃ (Δt₂+½Δt₃), the refresh voltage decreases monotonically, and reaches thenegative peak value V_(r−) whose maximum and minimum values arerepresented by V_(r−)(max) and V_(r−)(min) at half Δt₃. In the followingsecond half of Δt₃ and Δt₄, the refresh voltage pulse increasesmonotonically from the negative peak value and returns to the initialvalue V_(b0) at the beginning of Δt₅.

Alternative to the reparation process as discussed with reference toFIG. 6 and FIGS. 7 a and 7 b where two consecutive refresh voltagepulses are provided and are applied during the transition period, thereparation process may have one single refresh voltage pulse. Suchrefresh voltage may have the same amplitude as any one of the abovediscussed two refresh voltage pulses—the pulses at time T_(p) and T₄;and any polarization. However, the reparation process with one singlerefresh pulse may have disadvantages. As a way of example but withoutlosing the generality, assuming the reparation process comprises onesingle refresh voltage pulse at time T_(p), such single refresh voltagemay only repair stick micromirrors experiencing bias inversion duringtime from T₂ to T_(p), while can not repair the micromirrorsexperiencing inversion during time from T_(p) to T. Therefore, suchreparation process may not be efficient.

The reparation process with the single refresh voltage pulse may beapplied at time T when all micromirrors finish the bias inversion. Withthis application scheme, the single refresh voltage pulse can repair allstuck micromirrors with both of the V_(e+) and V_(e−) voltages at theaddressing electrodes, though this reparation process is less preferred.

Alternatively to the reparation process where the two consecutiverefresh voltage pulses are applied during the transition period, analternative reparation process having two refresh voltage pulses one ofwhich is applied after the termination of the transition period is alsoapplicable, as shown in FIG. 8, though less preferred.

Referring to FIG. 8, T₂ to T₃ is a transition time where the biasvoltage changes from V_(b+) to the low voltage V_(b0). At time T₃, thetransition is expected to be finished, wherein the addressing electrodesare at voltage V_(e−) and the mirror plates are at the bias voltage ofV_(b0). During the transition period, the first refresh voltage pulse isapplied. However, this first refresh voltage pulse is not able to repairthe stuck micromirrors experiencing the micromirrors experiencingtransition after the application of the first refresh voltage pulse. Forthis reason, in the following period from T₃ to T, the micromirrors are“blanked”, where no image data of the desired image is fed into themicromirrors. During such blanking period, the second refresh voltagepulse is applied to repair the remaining stuck micromirrors after theapplication of the first refresh voltage pulse. This reparation processis less favored because the “blanking” period from T₃ to T can result indegradation of the brightness of the displayed image.

Alternative to the reparation process as discussed above with referenceto FIG. 8, the process may also have one single refresh voltage pulsesuch as the refresh voltage pulse during the transition period or therefresh voltage pulse during the “blanking” period.

The refresh voltage pulse as discussed above can be applied to differentmicromirrors having a deflectable mirror plate and a stopping mechanism.The micromirror having a cross-section view of FIG. 3 is one of manyexamples. Referring again to FIG. 3, the mirror plate can be attached tothe deformable hinge symmetrically or asymmetrically. When the mirrorplate is attached to the deformable hinge with the attachment pointsubstantially at or around the geometric (or mass) center of the mirrorplate, the mirror plate rotates symmetrically—that is, the maximumangles achievable by the mirror plate rotating in opposite directionsare substantially the same. Alternatively, when the attachment point isoffset from the geometric (or mass) center of the mirror plate, themirror plate rotates asymmetrically—that is the maximum anglesachievable by the mirror plate in opposite directions are different. Theasymmetric rotation of the mirror plate is more advantageous inobtaining higher contrast ratio. The ON state angle of the presentinvention is preferably 12° degrees or more, such as 14° degrees ormore, and 14° degrees or more. The OFF state can be a state where themirror plate is parallel to the substrate on which the mirror plates areformed, such as substrate 120. The OFF state angle can be other values,such as −1° degree or less, such as −2° degrees or less, and −4° degreesor less, wherein the minus sign “−” represents the opposite rotationdirection in relation to the ON state angle. Such ON and OFF stateangles can be achieved by attaching the mirror plate asymmetrically tothe deformable hinge. Specifically, the hinge contact (128) contacts atthe mirror plate at a location away from the geometric or mass center ofthe mirror plate. As a result, the deformable hinge, as well as therotation axis is not along a diagonal of a diagonal of the mirror platewhen viewed from the top of the mirror plate at the non-deflected state.Exemplary micromirrors of asymmetric rotation will be better illustratedin perspective views in FIGS. 8 to 11 afterwards.

In the cross-section view of FIG. 3, the deformable hinge and the mirrorplate are in different planes. Alternatively, the mirror plate and thedeformable hinge can be in the same plane. For example, the mirror plateand the deformable hinge can be fabricated or derived from a single flatsubstrate, such as a single crystal (e.g. single crystal silicon).Alternatively, the mirror plate and the deformable hinge can be derivedfrom one deposited film by patterning. The stopper (e.g. stopper 130)can be in the same plane of the deformable hinge, but can also be indifferent planes of the deformable hinge.

In addition to the addressing electrode whose operation state (voltage)depends upon the image data of the desired image, an additionalelectrode for rotating the mirror plate in the direction opposite tothat driven by the addressing electrode can also be provided. Forexample, the additional electrode can be formed on substrate 120 onwhich the mirror plate is formed. Alternatively, the additionalelectrode can be formed on the micromirror on a side opposite to theaddressing electrode relative to the rotation axis of the mirror plate.

In the example as shown in FIG. 3, the deflectable mirror plates areformed on substrate 120 that is transmissive to the illumination lightto be modulated, such as glass and quartz when the illumination light isvisible light. The addressing electrodes and circuitry are formed onsubstrate 122 that can be a standard semiconductor substrate. In anotherembodiment of the invention, the mirror plates can be directly derivedfrom the light transmissive substrate, such as by patterning the lighttransmissive substrate so as to form the deflectable mirror plate. Inthis instance, the deformable hinge can be single crystal or depositedthin film, which will not be discussed in detail herein. As anotherexample, the mirror plates and the addressing electrodes can be formedon the same substrate, such as semiconductor substrate 122.

Addressing electrode 126 is preferably disposed such that the edge ofthe addressing electrode extending beyond the mirror plate, for example,beyond the furthest point of the mirror plate measured from thedeformable hinge, so as to maximize the utilization efficiency of theelectrostatic field, as set forth in U.S. patent application Ser. No.10/947,005 filed Sep. 21, 2004, the subject matter being incorporatedherein by reference. In an embodiment of the invention, each mirrorplate is addressed and deflected by one single addressing electrode. Inthis instance, the mirror plate is rotated to the ON state by anelectrostatic force derived from the electrostatic field establishedbetween the mirror plate and the addressing electrode.

Referring to FIG. 9, a perspective view of an exemplary micromirrordevice in which embodiments of the invention are applicable isillustrated therein. Micromirror device 180 comprises substrate 190 thatis a light transmissive substrate such as glass or quartz andsemiconductor substrate 182. Deflectable and reflective mirror plate 184is spaced apart and attached to deformable hinge 186 via a hingecontact. The deformable hinge is affixed to and held by posts 188. Thesemiconductor substrate has addressing electrode 192 for deflecting themirror plate. In this particular example, the light transmissivesubstrate operates as a stopper for stopping the rotation of the mirrorplate at the ON state.

A top view of the micromirror in FIG. 9 is illustrated in FIG. 9. As canbe seen in FIG. 10, deformable hinge 186 is not along but offset fromthe symmetrical axis OO′ of the mirror plate such that the mirror plateis operable to rotate asymmetrically. The deformable hinge is locatedbeneath the mirror plate in the direction of the incident light. Thatis, the mirror plate is located between the light transmissive substrateand the deformable hinge such that the deformable hinge is notilluminated by the incident light so as to prevent unexpected lightscattering from the deformable hinge, thereby, increasing the contrastratio of the produced image. The quality of the produced image isfurther improved through reduction of the light scattering from theedges of the mirror plate by forming the edges of the mirror plate intozigzagged shape, as shown in the figure.

Another exemplary micromirror device having a cross-sectional view ofFIG. 3 is illustrated in its perspective view in FIG. 11. Referring toFIG. 11, deflectable reflective mirror plate 124 with a substantiallysquare shape is formed on light transmissive substrate 120, and isattached to deformable hinge 132 via hinge contact 128. The deformablehinge is held by hinge support 134, and the hinge support is affixed andheld by posts on the light transmissive substrate. For electrostaticallydeflecting the mirror plate, an addressing electrode (not shown in thefigure for simplicity purposes) is fabricated in the semiconductorsubstrate 122. For improving the electrical coupling of the deflectablemirror plate to the electrostatic field, extending metallic plate 136can be formed on the mirror plate and contacted to the mirror plate viapost 138.

The mirror plate is preferably attached to the deformable hingeasymmetrically such that the mirror plate can be rotated asymmetricallyin favor of high contrast ratio. The asymmetric attachment is betterillustrated in FIG. 12. Referring to FIG. 12, mirror plate comprisesdiagonals BB and CC. Deformable hinge is disposed with its lengthparallel to a diagonal (e.g. BB) of the mirror plate. However, thelength of the deformable is not along any diagonal of the mirror platein the top view when the mirror plate is parallel to the lighttransmissive substrate. Of course, the mirror plate can be attached tothe deformable hinge symmetrically by placing the attachment pointaround the geometric or mass center of the mirror plate, which will notbe discussed in detail herein.

Similar to that in FIG. 9, the deformable hinge is preferably formedbeneath the deflectable mirror plate in the direction of the incidentlight so as to avoid unexpected light scattering by the deformablehinge. For reducing unexpected light scattering of the mirror plateedge, the illumination light is preferably incident onto the mirrorplate along a corner of the mirror plate.

Referring to FIG. 13, an exemplary spatial light modulator having anarray of micromirrors of FIG. 11 is illustrated therein. For simplicitypurposes, only 4×4 micromirrors are presented. In this example,micromirror array 148 is formed on light transmissive substrate 142; andaddressing electrode and circuitry array 146 is formed on semiconductorsubstrate 144 for deflecting the micromirrors in the micromirror array.The deformable hinges of the micromirrors, as well as the addressingelectrodes are hidden from the incident light.

The micromirrors in the micromirror array of the spatial light modulatorcan be arranged in alternative ways, another one of which is illustratedin FIG. 14. Referring to FIG. 14, each micromirror is rotated around itsgeometric center an angle less than 45° degrees. The posts (e.g. 152 and154) of each micromirror (e.g. mirror 156) are then aligned to theopposite edges of the mirror plate. No edges of the mirror plate areparallel to an edge (e.g. edges 160 or 162) of the micromirror array.The rotation axis (e.g. axis 158) of each mirror plate is parallel tobut offset from a diagonal of the mirror plate when viewed from the topof the mirror plate at a non-deflected state.

For driving the micromirrors, an array of addressing electrodes areprovided and disposed proximate to the mirror plates. Each addressingelectrode is connected to the voltage output node of a circuitry, suchas a memory cell such that the voltage of the addressing electrode iscontrolled by the memory cell. An exemplary circuitry of an array ofmemory cells according to an embodiment of the invention is illustratedin FIG. 15. For simplicity purposes, only 3×4 memory cells arepresented. In this example, each row of memory cells is connected to atleast two word-lines for actuating the memory cells in the row. Thememory cells can be connected to the wordlines in many different ways.For example, the memory cells can be connected to the two wordlinesalternatively. With this configuration, the memory cells of each row canbe actuated separately and in different times, as set forth in U.S.patent application Ser. No. 10/407,061 to Richards filed on Apr. 2,2003, the subject matter being incorporated herein by reference. Thememory cells of the memory cell array can be standard RAM and DRAM.Alternatively, the memory cells can be “charge-pump memory cells” as setforth in U.S. patent application Ser. No. 10/340,162 to Richards filedJan. 10, 2003, the subject matter being incorporated herein byreference.

FIG. 16 illustrates the top view of another micromirror array having anarray of micromirrors of FIG. 9. In this example, each micromirror isrotated 45° degrees around its geometric center. For addressing themicromirrors, the bitlines and wordlines are deployed in a way such thateach column of the array is connected to a bitline but each wordlinealternatively connects micromirrors of adjacent rows. For example,bitlines b₁, b₂, b₃, b₄, and b₅ respectively connect micromirrors groupsof (a₁₁, a₁₆, and a₂₁), (a₁₄ and a₁₉), (a₁₂, a₁₇, and a₂₂), (a₁₅ anda₂₀), and (a₁₃, a₁₈, and a₂₃). Wordlines w₁, w₂, and w₃ respectivelyconnect micromirror groups (a₁₁, a₁₄, a₁₂, a₁₅, and a₁₃), (a₁₆, a₁₉,a₁₇, a₂₀, and a₁₈), and (a₂₁, a₂₂, and a₂₃). With this configuration,the total number of wordlines is less the total number of bitlines.

For the same micromirror array, the bitlines and wordlines can bedeployed in other ways, such as that shown in FIG. 17. Referring to FIG.17, each row of micromirrors is provided with one wordline and onebitline. Specifically, bitlines b₁, b₂, b₃, b₄ and b₅ respectivelyconnect column 1 (comprising micromirrors a₁₁, a₁₆, and a₂₁), column 2(comprising micromirrors a₁₄ and a₁₉), column 3 (comprising micromirrorsa₁₂, a₁₇, and a₂₂), column 4 (comprising micromirrors a₁₅ and a₂₀), andcolumn 5 (comprising micromirrors a₁₃, a₁₈, and a₂₃). Wordlines WL₁,WL₂, WL₃, WL₄, and WL₅ respectively connect row 1 (comprisingmicromirrors a₁₁, a₁₂, and a₁₃), row 2 (comprising micromirrors a₁₄ anda₁₅), row 3 (comprising micromirrors a₁₆, a₁₇, and a₁₈), row 4(comprising micromirrors a₁₉ and a₂₀) and row 5 (comprising micromirrorsa₂₁, a₂₂, and a₂₃).

According to another embodiment of the invention, the mirror plates ofthe micromirrors in the array can form a plurality of pockets, in whichposts can be formed, wherein the pockets are covered by the extendedareas of the addressing electrodes when viewed from the top of themicromirror array device, as shown in FIGS. 18 a to 19.

Referring to FIG. 18 a, a portion of an array of mirror plates of themicromirrors is illustrated therein. The mirror plates in the array forma plurality of pockets in between. For example, pockets 172 a and 172 bare formed in which posts for supporting and holding mirror plate 174can be formed. For individually addressing and deflecting the mirrorplates in FIG. 18 a, an array of addressing electrodes is provided, aportion of which is illustrated in FIG. 18 b.

Referring to FIG. 18 b, each addressing electrode has an extendedportion, such as extended portion 178 of addressing electrode 176.Without the extended portion, the addressing electrode can be generallysquare, but having an area equal to or smaller than the mirror plate.

FIG. 19 illustrates a top view of a micromirror array device after theaddressing electrodes in FIG. 17 b and the mirror plates in FIG. 18 abeing assembled together. It can be seen in the figure that eachaddressing electrode is displaced a particular distance along a diagonalof the mirror plate associated with the addressing electrode. As aresult, the pockets presented between the mirror plates are covered bythe addressing electrode, specifically by the extended portions of theaddressing electrodes. In this way, light scattering otherwise occurredin the substrate having the addressing electrodes can be removed. Thequality, such as the contrast ratio of the displayed images can beimproved.

When used in a spatial light modulator of a display system as shown inFIG. 1, the incident light beam is directed onto the mirror plates in adirection along the displacement direction of the addressing electrodeswhen viewed from the top of the addressing electrodes as shown in thefigure. For example, the incident light has an angle θ to an edge of theaddressing electrode (or the mirror plate) when viewed from the top; andthe angle can be 135° degrees.

The micromirrors in which embodiments of the invention can beimplemented may be composed of any suitable materials and fabricated inmany ways. According to the invention, the deflectable mirror platecomprises reflective film, preferably composed of a metallic material(e.g. aluminum, gold, silver) having a high reflectivity, deposited onanother non-metallic material, such as SiO_(x), SiN_(x) and TiN_(x) forenhancing the mechanical properties of the mirror plate. Alternatively,other materials, such as a barrier layer for preventing diffusionbetween the metallic reflecting layer and the mechanical enhancinglayer, can be deposited between the metallic reflecting layer and themechanical enhancing layer.

The deformable hinge preferably comprises an electrically conductivelayer. Examples of suitable materials for the hinge layer are Al, Ir,titanium, titanium nitride, titanium oxide(s), titanium carbide,TiSiN_(x), TaSiN_(x), or other ternary and higher compounds.

The embodiments of the present invention can be implemented in hardwaredevices, such as integrated circuits either analog or digital, such asbias driver 206 of controller 202 in FIG. 20. Referring to FIG. 20,controller 202, which further comprises voltage controller 204, is acontrolling unit that controls the voltages on the mirror plates andelectrodes. Specifically, the controller selectively activates memorycells (e.g. memory cell 214) in response to activation signals and setsthe selected memory cells into desired voltage states. The electrodesconnected to the selected memory cells are accordingly set to desiredvoltages for driving the mirror plate to rotate. Bias driver 206controls applications of the voltages to the mirror plates andelectrodes. In particular, bias driver 206 may perform the applicationof the refresh voltage pulses of reparation processes and inventionprocess of inverting polarity of voltage differences across mirrorplates and electrodes in accordance with a predetermined procedure.

As a way of example, FIG. 21 illustrates a circuit design for the biasdriver of FIG. 20. As can be seen from the figure, the design iscomposed of transistors Q₁, Q₂, Q₃ and Q₄, and resistors R₁, R₂, R₃, R₄,R₅ and R₆. The source of transistor Q₂ and one end of resistor R₄ form avoltage node V_(B+). The drain of transistor Q₄ and one end of resistorR₆ form another voltage node V_(B−). The gate of transistor Q₁ is set tovoltage V_(DD). In this particular circuit design, the output voltageV_(out) from bias driver 206 depends upon the output signal B fromvoltage controller 204. Specifically, the V_(out) of bias driver 160 isV_(B+) (larger than V_(DD)) when the output signal B of the voltagecontroller is set to 0. And the output voltage V_(out) is V_(B−) (lessthan zero) when the output signal B of the voltage controller is set toV_(DD). FIG. 21 shows an exemplary circuit design for the bias driverand the controller of FIG. 20. In fact, the controller and the biasdriver can be any suitable circuit design as long as they provideelectric voltages to the mirror plate and/or the electrode and invertthe polarity of the voltage difference between the mirror plate and theelectrode.

Other than implementing the embodiments of the present invention incontroller 202, the embodiments of the present invention may also beimplemented in a microprocessor-based programmable unit, and the like,using instructions, such as program modules, that are executed by aprocessor. Generally, program modules include routines, objects,components, data structures and the like that perform particular tasksor implement particular abstract data types. The term “program” includesone or more program modules. When the embodiments of the presentinvention are implemented in such a unit, it is preferred that the unitcommunicates with the controller, takes corresponding actions tosignals, such as actuation signals from the controller, and invertspolarity of the voltage differences.

It will be appreciated by those skilled in the art that a new and usefulmethod and apparatus for transposing pixel data matrices into bitplanedata matrices for use in display systems having micromirror arrays havebeen described herein. In view of many possible embodiments to which theprinciples of this invention may be applied, however, it should berecognized that the embodiments described herein with respect to thedrawing figures are meant to be illustrative only and should not betaken as limiting the scope of invention. For example, those of skill inthe art will recognize that the illustrated embodiments can be modifiedin arrangement and detail without departing from the spirit of theinvention. Therefore, the invention as described herein contemplates allsuch embodiments as may come within the scope of the following claimsand equivalents thereof. In the claims, only elements denoted by thewords “means for” are intended to be interpreted as means plus functionclaims under 35 U.S.C. § 112, the sixth paragraph.

1-20. (canceled)
 21. A method of operating a device comprising an arrayof micromirrors each comprising a deflectable mirror plate and anaddressing electrode, the method comprising: applying a bias voltage tothe mirror plates and a set of voltages to the addressing electrodesduring a sequence of color field periods; and applying first refreshvoltage pulse to the mirror plates during a spoke period intervening twoadjacent color field periods.
 22. The method of claim 21, furthercomprising: applying the bias voltage to the mirror plate and a voltageto the addressing electrode associated with said mirror plate such thatthe mirror plate is rotated to an ON state angle of 10° degrees or morefrom a non-deflected state, wherein the difference between said twovoltages is 30 volts or more. 23-26. (canceled)
 27. The method of claim21, further comprising: performing a reparation process that comprisesthe first and a second refresh voltage following the first voltagepulses for the micromirrors, wherein the first and second refreshvoltage pulses are spaced in time longer than the intrinsic oscillationtime of the micromirror.
 28. The method of claim 27, wherein thereparation process further comprises: adjusting the bias voltage and thevoltages on the addressing electrodes such that the micromirrors areexpected to be in the OFF state; and applying the first and secondrefresh voltage pulses to repair a stuck micromirror in the ON state.29. The method of claim 28, wherein the reparation process is performedat most once during each frame period of a sequence of frames.
 30. Themethod of claim 27, wherein the reparation process is performed eitherduring selected frames of the sequence of frames or during a spoke timeperiod intervening two of a sequence of color field period. 31-33.(canceled)
 34. The method of claim 21, wherein the polarization of thefirst refresh voltage pulse is opposite to the polarity of the biasvoltage.
 35. The method of claim 21, wherein the mirror plate comprisesa metallic reflecting layer and a non-metallic layer, and each mirrorplate is attached to a deformable hinge that comprises an electricconductive layer and a non-metallic layer; and wherein the deformablehinge deforms under the refresh voltage pulses so as to produce arestoration energy when the mirror plate is at the OFF state. 36.(canceled)
 37. The method of claim 21, further comprising: changing thebias voltage from first value to second value, wherein the micromirroris expected to be at the OFF state with the second value of the biasvoltage; maintaining the bias voltage at the second value for atransition time period where the mirror plates at the ON state areexpected to be at the OFF state; and performing the reparation processduring said transition time period.
 38. The method of claim 27, whereinthe reparation process lasts for a time period selected from the groupconsisting of 10 microseconds or less and 1 microsecond or less. 39.(canceled)
 40. A method of operating a device comprising an array ofmicromirrors each comprising a deflectable mirror plate and anaddressing electrode, the method comprising: switching the micromirrorsbetween an ON and OFF state with first bias voltage and a set ofvoltages on the addressing electrodes; and applying first and secondrefresh voltage pulses to the micromirrors, wherein the first and secondrefresh voltage pulses are spaced in time longer than the intrinsicoscillation time of the micromirrors.
 41. The method of claim 40,wherein the step of switching the micromirrors between the ON and OFFstates further comprises: applying a bias voltage to the mirror platesof the micromirrors and a set of voltages to the addressing electrodes,wherein the voltages on the addressing electrodes are determinedaccording to a set of image data produced from an image using apulse-width-modulation technique.
 42. The method of claim 41, furthercomprising: applying the bias voltage to the mirror plate and a voltageto the addressing electrode associated with said mirror plate such thatthe mirror plate is rotated to an ON state angle of 10° degrees or morefrom a non-deflected state, wherein the difference between said twovoltages is 30 volts or more.
 43. The method of claim 42, wherein the ONstate angle is 12° degrees or more relative to the non-deflected state.44. The method of claim 42, further comprising: adjusting at least oneof the applied bias voltage and the voltage on the addressing electrodesuch that the voltage difference between the mirror plate and addressingelectrode is 17 volts or less.
 45. The method of claim 42, wherein thevoltage on the addressing electrode changes 10 volts or more when themirror plate switches between the ON and OFF states.
 46. The method ofclaim 45, wherein the change of the voltage on the addressing electrodeis from 13 to 25 volts when the mirror plate switches between the ON andOFF states.
 47. The method of claim 40, wherein the step of applying aset of refresh voltage pulses further comprises: performing a reparationprocess that comprises first and second refresh voltage pulses for themicromirrors, wherein the first and second refresh voltage pulses arespaced in time longer than the intrinsic oscillation time of themicromirror.
 48. The method of claim 47, wherein the reparation processfurther comprises: adjusting the bias voltage and the voltages on theaddressing electrodes such that the micromirrors are expected to be inthe OFF state; and applying the first and second refresh voltage pulsesto repair a stuck micromirror in the ON state. 49-79. (canceled)
 80. Acomputer readable medium comprising computer executable instructions forperforming the method of claim
 21. 81. A computer readable mediumcomprising computer executable instructions for performing the method ofclaim
 40. 82. (canceled)